{"id":291978,"date":"2025-02-10T11:58:00","date_gmt":"2025-02-10T03:58:00","guid":{"rendered":"http:\/\/www.namnewsnetwork.org\/?p=291978"},"modified":"2025-02-10T11:58:00","modified_gmt":"2025-02-10T03:58:00","slug":"nearfield-instruments-receives-purchase-orders-from-major-us-customer-and-establishes-nearfield-instruments-usa-inc","status":"publish","type":"post","link":"http:\/\/namnewsnetwork.org\/?p=291978","title":{"rendered":"Nearfield Instruments Receives Purchase Orders From Major US Customer, And Establishes Nearfield Instruments USA Inc."},"content":{"rendered":"\n<p><strong>ROTTERDAM, The Netherlands, Feb 10 (Bernama-GLOBE NEWSWIRE) &#8212;<\/strong>&nbsp;Nearfield Instruments, a leading provider of advanced metrology and inspection solutions for the semiconductor industry, is pleased to announce the establishment of its U.S. subsidiary, Nearfield Instruments USA Inc. This strategic move strengthens the company\u2019s presence in North America, allowing it to better support customers in the region and accelerate the adoption of its cutting-edge metrology technologies. The incorporation of Nearfield Instruments USA Inc. is further driven by the receival of multiple system orders from a US customer, reinforcing the company&#8217;s growth trajectory and market demand for its innovative metrology solutions. \u201cWe\u2019re excited to share that our flagship product QUADRA has been selected by our US customer as part of the development of its newest production technology. What a great way to launch Nearfield\u2019s business in the US,\u201d according to Jeroen Verbiest, VP Sales &amp; Marketing of Nearfield Instruments.<\/p>\n\n\n\n<p>Nearfield Instruments USA Inc. specializes in high-precision, non-destructive metrology and inspection solutions that enable semiconductor manufacturers to achieve unprecedented accuracy in process control at the nanoscale. As the demand for higher-performance semiconductor devices continues to grow, Nearfield\u2019s innovative solutions play a crucial role in ensuring manufacturing efficiency and yield optimization.<\/p>\n\n\n\n<p><a href=\"http:\/\/mrem.bernama.com\/viewsm.php?idm=50303\">http:\/\/mrem.bernama.com\/viewsm.php?idm=50303<\/a><\/p>\n","protected":false},"excerpt":{"rendered":"<p>ROTTERDAM, The Netherlands, Feb 10 (Bernama-GLOBE NEWSWIRE) &#8212;&nbsp;Nearfield Instruments, a leading provider of advanced metrology and inspection solutions for the semiconductor industry, is pleased to announce the establishment of its U.S. subsidiary, Nearfield Instruments USA Inc. This strategic move strengthens the company\u2019s presence in North America, allowing it to better support customers in the region [&hellip;]<\/p>\n","protected":false},"author":14,"featured_media":0,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":[],"categories":[315],"tags":[],"_links":{"self":[{"href":"http:\/\/namnewsnetwork.org\/index.php?rest_route=\/wp\/v2\/posts\/291978"}],"collection":[{"href":"http:\/\/namnewsnetwork.org\/index.php?rest_route=\/wp\/v2\/posts"}],"about":[{"href":"http:\/\/namnewsnetwork.org\/index.php?rest_route=\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"http:\/\/namnewsnetwork.org\/index.php?rest_route=\/wp\/v2\/users\/14"}],"replies":[{"embeddable":true,"href":"http:\/\/namnewsnetwork.org\/index.php?rest_route=%2Fwp%2Fv2%2Fcomments&post=291978"}],"version-history":[{"count":1,"href":"http:\/\/namnewsnetwork.org\/index.php?rest_route=\/wp\/v2\/posts\/291978\/revisions"}],"predecessor-version":[{"id":291979,"href":"http:\/\/namnewsnetwork.org\/index.php?rest_route=\/wp\/v2\/posts\/291978\/revisions\/291979"}],"wp:attachment":[{"href":"http:\/\/namnewsnetwork.org\/index.php?rest_route=%2Fwp%2Fv2%2Fmedia&parent=291978"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"http:\/\/namnewsnetwork.org\/index.php?rest_route=%2Fwp%2Fv2%2Fcategories&post=291978"},{"taxonomy":"post_tag","embeddable":true,"href":"http:\/\/namnewsnetwork.org\/index.php?rest_route=%2Fwp%2Fv2%2Ftags&post=291978"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}