ROTTERDAM, Netherlands, Dec 23 (Bernama-GLOBE NEWSWIRE) — Nearfield Instruments, a pioneer in advanced process control metrology solutions, is proud to announce that it has received repeat purchase orders for its flagship QUADRA High-Throughput Process Control Metrology System. This follow-up order highlights Nearfield Instruments’ increasing market traction and its success in penetrating high-volume manufacturing operations.
The QUADRA system offers cutting-edge capabilities for in-line process control by Nearfield’s high-throughput AFM metrology technologies that deliver highly accurate, non-destructive 3D measurements of critical semiconductor parameters. By providing real-time feedback on critical device structures, the system provides good correlation to device yield and enables manufacturers to maintain high yields and optimal performance in their production lines. QUADRA’s exceptional throughput allows manufacturers to quickly and accurately analyze large numbers of devices without compromising measurement precision, ensuring both efficiency and quality in the production process.